Measuring Device for Diffraction Patterns
Published in Review of Scientific Instruments • Mar 1, 1959
NobleIDNI3P91W89R75S64
Authors:
Maynard J. Columbe
Abstract
A device for accurate measurement of diffraction patterns is described in detail. The accuracy of measurement is better than 0.01%. In addition, this device is useful for viewing photographic negatives and can also be used for other kinds of measurements.
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