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A New Reliability Function

Published in IEEE Transactions on Reliability • Jun 1, 1974
NobleIDNI9P43W77R73S47
Authors:
Y.C. Yeh
,
Ching Lai Sheng

Abstract

Based on the Markov model for the description of the reliability behavior of an item and on the mixed-exponential expression for the reliability analysis, a new reliability function is defined. By introducing pseudointervals, states are defined corresponding to pseudointervals for a set of time-inte...

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