Quantitative surface analysis: Agreeing initial data processing
Published in Journal of Vacuum Science & Technology A Vacuum Surfaces and Films • May 1, 1991
NobleIDNI6P84W44R44S83
Authors:
M. P. Seah
Abstract
The concept of agreement, its related policy and traceability in quantitative surface analysis are briefly reviewed. Current work from National Physical Laboratory (NPL) is then reviewed to enable laboratories to obtain Auger electron and x-ray photoelectron spectra which agree numerically from labo...
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