Structural Analysis Using Interferometric Data
Published in Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE • Dec 20, 1985
NobleIDNI8P97W28R35S30
Authors:,
Paul T. Richardson
James A. de Haseth
Abstract
A technique utilizing Fourier domain data for the determination of structure features of compounds has been examined. By categorizing a large data set, similarities in Fourier domain data have been related to structural features. Predictions of molecular structure for a compound can be made by deter...
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