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Defect structures at solid surfaces

Published in Surface and Interface Analysis • Feb 1, 1981
NobleIDNI9P49W08R78S55
Authors:
M. G. Lagally
,
David Welkie

Abstract

Abstract The analysis of surface structural defects at the atomic level using low energy electron diffraction (LEED) is briefly considered. The angular distribution of the diffracted intensity contains information on the defect structure. A number of defects can be distinguished and quantified by st...

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