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Accelerating Soft Error Rate Testing Through Pattern Selection

Published • Jul 1, 2007
NobleIDNI3P26W55R05S38
Authors:
Alodeep Sanyal
,
Kunal Ganeshpure
,
Sandip Kundu

Abstract

In this paper we propose a technique for increasing the rate of failure due to soft errors by carefully choosing the patterns for soft-error detection. It is well known that all circuit nodes are not equally vulnerable to soft error. We propose a metric for measuring vulnerability of a node to soft-...

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