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Double-pass point diffraction interferometer

Published in Measurement Science and Technology • Sep 14, 2010
NobleIDNI0P26W42R96S04
Authors:
Hagyong Kihm
,
Yun-Woo Lee

Abstract

We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quar...

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