Double-pass point diffraction interferometer
Published in Measurement Science and Technology • Sep 14, 2010
NobleIDNI0P26W42R96S04
Authors:,
Hagyong Kihm
Yun-Woo Lee
Abstract
We propose a new point diffraction interferometer for qualitative optical analysis. Point diffraction is made two times to generate interfering waves with a single pinholed polarizer. Diffraction from a pinholed polarizer makes reference and measurement waves with a double-pass configuration. A quar...
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