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Random test generation using concurrent logic simulation

Published in Design Automation Conference • Jan 1, 1975
Authors:
Donald M. Schuler
,
Ernst G. Ulrich
,
Thomas E. Baker

Abstract

All approaches to automatic test generation consist of two complementary parts, namely, the generation of test vectors and verification to measure their adequacy. Path sensitizing is a well-known basic approach in which highly complex techniques used for vector generation represent the major effort ...

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