Random test generation using concurrent logic simulation
Published in Design Automation Conference • Jan 1, 1975
Authors:,,
Donald M. Schuler
Ernst G. Ulrich
Thomas E. Baker
Abstract
All approaches to automatic test generation consist of two complementary parts, namely, the generation of test vectors and verification to measure their adequacy. Path sensitizing is a well-known basic approach in which highly complex techniques used for vector generation represent the major effort ...
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