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Random Pattern Testability

Published in IEEE Transactions on Computers • Jan 1, 1984
NobleIDNI7P46W77R47S84
Authors:
J. Savir
,
Gary S. Ditlow
,
Paul H. Bardell

Abstract

A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is...

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