Observer Development for Automatic STEM Closed-Loop Control
Published in Microscopy and Microanalysis • Jul 1, 2009
NobleIDNI5P74W70R04S90
Authors:,,
Arturo Tejada
Arnold J. den Dekker
SW van der Hoeven
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
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