Thin layer analysis using offset/amplitude data
Published in International Meeting for Applied Geoscience & Energy • Jan 1, 1986
NobleIDNI7P93W90R85S78
Authors:,
Francois Hindlet
John A. McDonald
Abstract
PreviousNext No AccessSEG Technical Program Expanded Abstracts 1986Thin layer analysis using offset/amplitude dataAuthors: Francois J. F. HindletJohn A. McDonaldFrancois J. F. HindletElf Aquitaine Petroleum and SAL, University of Houston and John A. McDonaldSAL, University of Houstonhttps://doi.org/...
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