Testability-Driven Statistical Path Selection
Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • Jul 13, 2012
Authors:,,
Jaeyong Chung
Jinjun Xiong
Vladimir Zolotov
Abstract
In the face of large-scale process variations, statistical timing methodology has advanced significantly over the last few years, and statistical path selection takes advantage of it in at-speed testing. In deterministic path selection, the separation of path selection and test generation is known t...
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