Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors
Published in IEEE Transactions on Very Large Scale Integration (VLSI) Systems • Aug 10, 2012
Authors:,,
Ying Zhang
Huawei Li
Xiaowei Li
Abstract
Software-based self-testing (SBST) has been a promising method for processor testing, but the complexity of the state-of-art processors still poses great challenges for SBST. This paper utilizes the executing trace collected during executing training programs on the processor under test to simplify ...
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