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Efficient Test Pattern Compression Techniques Based on Complementary Huffman Coding

Published • Apr 1, 2009
Authors:
Shyue-Kung Lu
,
Hei-Ming Chuang
,
Guan-Ying Lai

Abstract

In this paper, complementary Huffman encoding techniques are proposed for test data compression of complex SOC designs during manufacturing testing. The correlations of blocks of bits in a test data set are exploited such that more blocks can share the same codeword. Therefore, beside the compatible...

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