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Multiresolution 2-dimensional edge analysis using wavelets

Published • Dec 30, 2002
NobleIDNI0P83W57R19S95
Authors:
Kunio Takaya
,
Gordon E. Sarty
,
Xianguo Li

Abstract

The authors show that wavelet transforms can be used in an empirical way to improve edge-detected pictures. Specifically, the first derivative of a Gaussian distribution function is used as the wavelet for detecting edges. The wavelet transforms are calculated using integer scales instead of dyadic ...

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