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Dynamically replicated memory

Published in ACM SIGARCH Computer Architecture News • Mar 5, 2010
NobleIDNI9P10W16R47S47
Authors:
Engin İpek
,
Jeremy Condit
,
Edmund B. Nightingale

Abstract

DRAM is facing severe scalability challenges in sub-45nm tech- nology nodes due to precise charge placement and sensing hur- dles in deep-submicron geometries. Resistive memories, such as phase-change memory (PCM), already scale well beyond DRAM and are a promising DRAM replacement. Unfortunately, P...

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