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Classification using pattern probability estimators

Published • Jun 1, 2010
Authors:
Jayadev Acharya
,
Hirakendu Das
,
Alon Orlitsky

Abstract

We consider the problem of classification, where the data of the classes are generated i.i.d. according to unknown probability distributions. The goal is to classify test data with minimum error probability, based on the training data available for the classes. The Likelihood Ratio Test (LRT) is the...

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