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Deterministic pattern generation for weighted random pattern testing

Published in European Design and Test Conference • Mar 11, 1996
NobleIDNI6P15W95R97S38
Authors:
Birgit Reeb
,
Hans-Joachim Wunderlich

Abstract

Weighted random pattern testing is now widely accepted as a very economic way for external testing as well as for implementing a built-in self-test (BIST) scheme. The weights may be computed either by structural analysis or by extracting the required information from a precomputed deterministic test...

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