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PC based diffraction pattern analysis programs

Published in Proceedings annual meeting Electron Microscopy Society of America • Jan 1, 1988
Authors:
A. G. Jackson
,
Mark Rowe

Abstract

The analysis of electron diffraction patterns can be done automatically using image techniques for collecting the diffraction pattern. This is useful if the material is well known. The alternative when the material is not well known is to do hand measurements on the plate and then enter that data in...

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