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The Estimation of the Dielectric Strength Decrease of the Solid-solid Interfaces by using the Applied Voltage to Breakdown Time Characteristics

Published in Transactions on Electrical and Electronic Materials • Dec 31, 2007
Authors:
Cheol-Gi Shin
,
Duck-Kweon Bae

Abstract

In the complex insulation system that is used in extra high voltage(EHV) devices, according to the trend for electric power equipment of high capacity and reduction of its size, macro interfaces between two different bulk materials which affect the stability of insulation system exist inevitably. In...

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