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Current testing

Published • Dec 4, 2002
NobleIDNI6P97W47R01S52
Authors:
W. Maly

Abstract

Summary form only given. It is pointed out that current testing is and will increasingly become attractive as a main technique for testing static CMOS circuits. BIC (built-in current) testing can provide testing qualities achievable with other testing techniques. It is suggested that future testing ...

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