Microcrystal diffraction techniques
Published in Acta Crystallographica Section A Foundations of Crystallography • Aug 12, 1987
NobleIDNI8P14W87R16S92
Authors:,
J. M. Newsam
H. E. King
Abstract
C-259with the necessary sensitivity using conventional methods.By energy dispersive diffraction we have been able to determine preferred orientation parameters in thin palladium films grown in (lll) orientation and co-deposited with rare gases. Structure analysis as a f~~ction of depth in thin films...
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