Microcode-Based Memory BIST Implementing Modified March Algorithms
Published in Journal of the Korean Physical Society • Apr 1, 2002
NobleIDNI5P61W37R41S99
Authors:,,
Sungju Park
Youn Donkyu
Tae-Hyung Kim
Abstract
A new microcode-based BIST (built-in self test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting degree of freedom concept to detect address decoder open faults on top of conventional stuck faults....
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