Automatic Test Pattern Generation
Published in The electrical engineering handbook/Electrical engineering handbook series/Electrical engineering handbook • Dec 26, 2006
Authors:
Spyros Tragoudas
Abstract
The complexity of VLSI devices increases rapidly as technology increases, resulting in an increase in the difficulty of test generation.Traditional test generation algorithms target one fault of a fault set at a time to generate a test.This paper presents a brief overview of a few different approach...
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