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Microprocessor Testing: Functional Meets Structural Test

Published in Journal of Circuits Systems and Computers • Mar 3, 2017
NobleIDNI0P08W22R60S49
Authors:
A. Touati
,
Alberto Bosio
,
Patrick Girard

Abstract

Structural test is widely adopted to ensure high quality for a given product. The availability of many commercial tools and the use of fault models make it very easy to generate and to evaluate. Despite its efficiency, structural test is also known for the risk of over-testing that may lead to yield...

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