Surface Analysis
Published • Mar 13, 2001
Authors:
John C. Rivière
Abstract
The prelims comprise: Introduction X-Ray Photoelectron Spectroscopy (XPS) Auger Electron Spectroscopy (AES) Static Secondary Ion Mass Spectrometry (SSIMS) Ion Scattering Spectroscopies (ISS and RBS) Scanning Tunneling Methods (STM, STS, AFM) Other Surface Analytical Methods Summary and Comparison of...
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