Surface X‐Ray Diffraction
Published in Characterization of Materials • Oct 15, 2002
NobleIDNI2P55W17R41S17
Authors:
Ian Robinson
Abstract
Abstract Surface x‐ray diffraction allows the determination of atomic structures of ordered crystal surfaces in an analogous way to x‐ray crystallography for the determination of three‐dimensional crystal structures. In doing this, crystallographic parameters such as lattice constants and Debye‐Wall...
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