Optimized Programs For Testing Image Processing Algorithms
Published in Proceedings annual meeting Electron Microscopy Society of America • Jan 1, 1977
NobleIDNI3P17W95R68S86
Authors:
T. A. Welton
Abstract
Previously reported programs 1-3 for the enhancement of bright field electron micrographs have now been made much more flexible and trouble- free. In addition, the cost of image processing has been much reduced by careful attention to programming details. Finally, a program has been added to synthes...
Finding related papers...
Discussions
(0)No comments yet
Be the first to share your thoughts!