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Overparameterized Models for Vector Fields

Published in SIAM Journal on Imaging Sciences • Jan 1, 2020
NobleIDNI6P35W13R12S48
Authors:
Keren Rotker
,
Dafna Ben Bashat
,
Alex Bronstein

Abstract

Vector fields arise in a variety of quantity measure and visualization techniques, such as fluid flow imaging, motion estimation, deformation measures, and color imaging, leading to a better understanding of physical phenomena. Recent progress in vector field imaging technologies has emphasized the ...

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