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Class-Specific Interferometric Phase Estimation Using Patch-Based Importance Sampling

Published in IEEE Access • Jan 1, 2020
Authors:
Joshin Krishnan
,
Mário A. T. Figueiredo
,
José M. Bioucas‐Dias

Abstract

Interferometric phase (InPhase) estimation, that is, the denoising of modulo- $2\pi $ phase images from sinusoidal $2\pi $ -periodic and noisy observations, is a challenging inverse problem with wide applications in many coherent imaging techniques. This paper introduces a novel approach to InPhase ...

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