Class-Specific Interferometric Phase Estimation Using Patch-Based Importance Sampling
Published in IEEE Access • Jan 1, 2020
Authors:,,
Joshin Krishnan
Mário A. T. Figueiredo
José M. Bioucas‐Dias
Abstract
Interferometric phase (InPhase) estimation, that is, the denoising of modulo- $2\pi $ phase images from sinusoidal $2\pi $ -periodic and noisy observations, is a challenging inverse problem with wide applications in many coherent imaging techniques. This paper introduces a novel approach to InPhase ...
Finding related papers...
Discussions
(0)No comments yet
Be the first to share your thoughts!