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CMP Process Optimization Engineering by Machine Learning

Published in IEEE Transactions on Semiconductor Manufacturing • Apr 12, 2021
NobleIDNI0P02W63R17S34
Authors:
Hsiang-Meng Yu
,
Chih-Chen Lin
,
Min-Hsuan Hsu

Abstract

Advanced Chemical-mechanical polishing (CMP) process not only needs to maintain stable run-to-run thickness control but also achieve better within wafer/within chip planarization performance. Furthermore, slurries or other consumable parts, like PAD and Disks selection are also the keys for CMP proc...

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