Simulation-based techniques for dynamic test sequence compaction
Published in Proceedings of International Conference on Computer Aided Design • Dec 23, 2002
NobleIDNI8P11W49R51S85
Authors:,
E.M. Rudnick
J.H. Patel
Abstract
Simulation-based techniques for dynamic compaction of test sequences are proposed. The first technique uses a fault simulator to remove test vectors from the partially-specified test sequence generated by a deterministic test generator if the vectors are not needed to detect the target fault, consid...
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