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Compact Model Parameter Extraction using Bayesian Machine Learning

Published • Jun 20, 2023
NobleIDNI1P42W58R39S64
Authors:
Sachin Bhat
,
Sourabh Kulkarni
,
Csaba Andras Moritz

Abstract

Compact models are integral part of large-scale integrated circuit simulations and validation of new technologies. With technology scaling, however, compact models have become complex with lots of parameters involved. Hence, parameter extraction for new device technology is rather challenging. In th...

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