STEM serial electron diffraction data
Published in Zenodo (CERN European Organization for Nuclear Research) • Apr 19, 2023
Authors:,,
Pascal Hogan-Lamarre
Yi Luo
Xiaodong Zou
Abstract
Serial electron diffraction (SerialED) data of Zeolite Y and ZSM-25 (electron-beam sensitive). The data were collected under STEM mode on a Thermo Fisher Scientific Themis microscope (300kV) using a gatan oneview camera. The cRED data of FAU type zeolite was collected using a JEOL 2100 LaB6 TEM usin...
Finding related papers...
Discussions
(0)No comments yet
Be the first to share your thoughts!