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Применение метода относительных интенсивностей линий гелия для определения параметров геликонной низкотемпературной плазмы.

Nagel, Lisitsa, Shurovskiy and 1 other

28 Aug 2024Open access

NobleIDark:/48914/w1/20260526/85B37B75DOI10.34854/icpaf.51.2024.1.1.139

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