Orthogonal Array Testing

Taguchi, G; Montgomery, D; Runger, G; Taguchi, G; Chowdhury, S; Wu, Y; Phadke, M; Hedayat, A; Sloane, N; Stufken, J; Fisher, R; Yates, F; Bose, R; Bush, K; Labonte, A; Taguchi, G; Konishi, S; Kacker, R; Lagergren, E; Filliben, J; Bose, R; Plackett, R; Burman, J; Arpaia, P; Caiazza, D; Petrone, C; Russenschuck, S; Caiazza, D; Montgomery, D; Rice, J; Arpaia, P; Caiazza, D; Petrone, C; Russenschuck, S; Rao, C

doi:10.1002/9783527839599.app4

Public

Orthogonal Array Testing

Published • Apr 25, 2025

NobleIDNI3P94W87R88S57

Authors:

G Taguchi

,

D Montgomery

,

G Runger

Abstract

Model: The mathematical description of the system or process. Factors: The K variables that affect a response, such as design and noise parameters, and test configurations. Levels: The I levels that each factor can assume in the experiment.The factors are supposed to be fixed, that is, the I levels ...

Subject

Orthogonal array

Computer science

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