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スピンコート法によるYBCO薄膜の作製と評価2(デバイス・一般)

Published in 電子情報通信学会技術研究報告. SCE, 超伝導エレクトロニクス • Jan 16, 2004
Authors:
智之 松本
,
泰寛 田邉
,
敦 齊藤

Abstract

Conventional semilogarithmic plots of radioisotope-retained [y(t)], by membrane vesicles during efflux, against time give a gross overestimate of the half-life (t 1/2) of the efflux, if a significant proportion of the radioisotope is retained at equilibrium. By using simulated efflux experiments, it...

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