Fiber interferometer-based variable temperature scanning force microscope
Published in Review of Scientific Instruments • Apr 1, 1997
NobleIDNI9P45W29R68S77
Authors:,,
R. Euler
U. Memmert
U. Hartmann
Abstract
A scanning force microscope designed for an operation at temperatures between 4.2 and 300 K is presented. The deflection of the microfabricated force sensing cantilever is detected via an optical fiber interferometer. For low temperature imaging the whole instrument is incorporated into a bath cryos...
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