VLSI and Analog Circuit Testing

CMOS analog circuit design

Controlling the False Discovery Rate: A Practical and Powerful Approach to Multiple Testing

Multiple regression: testing and interpreting interactions

Co-Integration and Error Correction: Representation, Estimation, and Testing

The M06 suite of density functionals for main group thermochemistry, thermochemical kinetics, noncovalent interactions, excited states, and transition elements: two new functionals and systematic testing of four M06-class functionals and 12 other functionals

Development and testing of a general amber force field

Evaluating Goodness-of-Fit Indexes for Testing Measurement Invariance

Development and Testing of the OPLS All-Atom Force Field on Conformational Energetics and Properties of Organic Liquids

Testing for unit roots in heterogeneous panels

Testing Structural Equation Models.

Statistical method for testing the neutral mutation hypothesis by DNA polymorphism.

MODELTEST: testing the model of DNA substitution.

Bounds testing approaches to the analysis of level relationships

Testing for a unit root in time series regression

Testing the null hypothesis of stationarity against the alternative of a unit root

Influence of partially known parameter on flaw characterization in Eddy Current Testing by using a random walk MCMC method based on metamodeling

Trim and Fill: A Simple Funnel‐Plot–Based Method of Testing and Adjusting for Publication Bias in Meta‐Analysis

Antibiotic Susceptibility Testing by a Standardized Single Disk Method

Estimation and Hypothesis Testing of Cointegration Vectors in Gaussian Vector Autoregressive Models

The control of the false discovery rate in multiple testing under dependency