Impact of crystalline defects and size on X-ray line broadening: A phenomenological approach for tetragonal SnO2 nanocrystals

Muhammed Shafi, P.; Chandra Bose, A.

doi:10.1063/1.4921452

Public

Impact of crystalline defects and size on X-ray line broadening: A phenomenological approach for tetragonal SnO2 nanocrystals

Shared by NobleBlocks on May 1, 2015 • 12:00 AM UTC

Authors:

P. Muhammed Shafi

A. Chandra Bose

Abstract

Nanocrystalline tin oxide (SnO2) powders with different grain size were prepared by chemical precipitation method. The reaction was carried out by varying the period of hydrolysis and the as-prepared samples were annealed at different temperatures. The samples were characterized using X-ray powder d...

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