Test generation and design for test for a large multiprocessing DSP

Hetherington, G.; Sutton, G.; M. Butler, Kenneth; Powell, T.J.

doi:10.1109/test.1995.529828

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Test generation and design for test for a large multiprocessing DSP

Shared by NobleBlocks on Nov 19, 2002 • 12:00 AM UTC

Authors:

G. Hetherington

G. Sutton

Kenneth M. Butler

Abstract

The TMS320C80 is a programmable, parallel processing DSP. The test approach was an engineering mix of design for testability, test view creation, and verification. This mixture facilitated timely test generation and had other important benefits. We document the overall test methodology and the benef...

Subject

Test (biology)

Computer science

Automatic test pattern generation

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