Time-of-flight secondary ion mass spectroscopy characterization of the covalent bonding between a carbon surface and aryl groups.

Grafting of aryl layers derived from aryl diazonium salts onto glassy carbon electrodes is observed by time-of-flight secondary ion mass spectroscopy (ToF-SIMS). The grafting occurs spontaneously when a glassy carbon plate is immersed into a solution of aryl diazonium salt and can be enhanced by bia... View More