The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee

Grigg, C.; Wong, P.; F. Albrecht, P.; Allan, R.N.; Bhavaraju, M.P.; Billinton, R.; Chen, Q.; Fong, C.; Haddad, S.D.; Kuruganty, Sastry; Li, W.; Mukerji, R.; Patton, Declan; Rau, N.S.; Reppen, D.; Schneider, A.; Shahidehpour, Mohammad; Singh, Chanan

doi:10.1109/59.780914

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The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee

Shared by NobleBlocks on Jan 1, 1999 • 12:00 AM UTC

Authors:

C. Grigg

P. Wong

P. F. Albrecht

Abstract

This report describes an enhanced test system (RTS-96) for use in bulk power system reliability evaluation studies. The value of the test system is that it will permit comparative and benchmark studies to be performed on new and existing reliability evaluation techniques. The test system was develop...

Subject

Reliability (semiconductor)

Reliability engineering

Benchmark (surveying)

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