Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

Espinós, J.P.; Morales, J.J.; Barranco, Ángel; Caballero, Alfonso; P. Holgado, Juan; R. González‐Elipe, Agustín

doi:10.1021/jp014618m

Public

Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

Shared by NobleBlocks on Jun 19, 2002 • 12:00 AM UTC

Authors:

J.P. Espinós

J.J. Morales

Ángel Barranco

Abstract

Copper and copper oxides (Cu2O and CuO) have been deposited by evaporation of copper and subsequent oxidizing treatments, on the surface of flat SiO2 and ZrO2 substrates. Large variations of several eVs have been found in the values of the Cu 2p3/2 binding energy (BE) and Auger parameter (α‘) of cop...

Subject

Copper

X-ray photoelectron spectroscopy

Oxide

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