Investigation and Analysis of LM124 Bipolar Linear Circuitry Response Phenomenon in Pulsed X-Ray Environment

J.-H. Roche, Nicolas; Dusseau, L.; Vaillé, J.-R.; Mekki, Julien; Gonzalez Velo, Y.; Perez, S.; Boch, J.; Saigné, Frédéric; Marec, R.; Calvel, P.; Bezerra, F.; Auriel, G.; Azaïs, B.

doi:10.1109/tns.2010.2089063

Public

Investigation and Analysis of LM124 Bipolar Linear Circuitry Response Phenomenon in Pulsed X-Ray Environment

Shared by NobleBlocks on Dec 1, 2010 • 12:00 AM UTC

Authors:

Nicolas J.-H. Roche

L. Dusseau

J.-R. Vaillé

Abstract

Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon...

Subject

Flash (photography)

Transient (computer programming)

Amplifier

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