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Влияние нарушенных слоев на диэлектрические свойства конденсаторных структур на основе сегнетоэлектрических пленок

Published in Russian Technological Journal • Jun 1, 2016
Authors:
P. P. Lavrov
,
П.П. Лавров

Abstract

Capacitor ferroelectric structures are the basis of many modern microelectronic devices, including non-volatile memory, piezoelectric micro-actuators, sensors etc. Miniaturization of such devices requires a reduction in the ferroelectric layer thickness, which reduces the major characteristics of fe...

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