Влияние нарушенных слоев на диэлектрические свойства конденсаторных структур на основе сегнетоэлектрических пленок
Published in Russian Technological Journal • Jun 1, 2016
Authors:,
P. P. Lavrov
П.П. Лавров
Abstract
Capacitor ferroelectric structures are the basis of many modern microelectronic devices, including non-volatile memory, piezoelectric micro-actuators, sensors etc. Miniaturization of such devices requires a reduction in the ferroelectric layer thickness, which reduces the major characteristics of fe...
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