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Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current
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Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current
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NobleBlocks
on Jun 12, 2019 • 12:00 AM UTC
Authors:
S. Usami
,
N. Mayama
,
K. Toda
+5 more
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Direct evidence of Mg diffusion through threading mixed dislocations in GaN p–n diodes and its effect on reverse leakage current | NobleBlocks
