Raman Study of Polycrystalline Si3N4 Irradiated with Swift Heavy Ions

Zhumazhanova, Ainash; Mutali, Alisher; Ibrayeva, Anel; Skuratov, Vladimir; Dauletbekova, Alma; Korneeva, Ekaterina; Akilbekov, Abdirash; Zdorovets, Maxim

doi:10.3390/cryst11111313

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Raman Study of Polycrystalline Si3N4 Irradiated with Swift Heavy Ions

Shared by NobleBlocks on Oct 1, 2021 • 12:00 AM UTC

Authors:

Ainash Zhumazhanova

Alisher Mutali

Anel Ibrayeva

Abstract

A depth-resolved Raman spectroscopy technique was used to study the residual stress profiles in polycrystalline silicon nitride that was irradiated with Xe (167 MeV, 1 × 1011 cm−2 ÷ 4.87 × 1013 cm−2) and Bi (710 MeV, 1 × 1011 cm−2 ÷ 1...

Subject

swift heavy ions

QD901-999

piezospectroscopy

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