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Data Processing For Atomic Resolution EELS

Published in arXiv (Cornell University) • Dec 13, 2011
NobleIDNI5P80W45R08S94
Authors:
Paul Cueva
,
Robert Hovden
,
Julia A. Mundy

Abstract

The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) mapping with atomic resolution. These spectral maps are often dose-limited and spatially oversampled, leading to low counts/chann...

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