LHD PHA #9251.1
Published in NIFS • Oct 29, 2024
Authors:,
MUTO, Sadatsugu
MORITA, Shigeru
Abstract
Radial profiles of X-ray spectrum are obtained using an assembly of X-ray pulse height analyzer in LHD. Si(Li) semiconductor detectors are used with a histogramming memory and analog-to-digital converter (ADC) basically working at high counting rate up to 500 kcps.
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